FiniteElement Model
Another, perhaps more natural observable in NFMM experiments, is the reflection coefficient Su as a function of frequency from which, of course, the frequency shift can be obtained or Sn as a function of material property for a fixed frequency 20,21 . However, to model Sn is not very straightforward in that one cannot work solely with electrostatics. Furthermore, there are distance scales of very different sizes, for example, the cavity of order centimeters and the tip-sample distance of order...
NearField Microwave Microscopy for Nanoscience and Nanotechnology
Kiejin Lee, Harutyun Melikyan, Arsen Babajanyan, and Barry Friedman Abstract We have demonstrated the possibility of near-field microwave imaging of physical structures, such as thin films, bulk material, fluids, etc. by using a near-field microwave microscopy NFMM . We have developed theoretical models for the microwave reflection coefficient Sii and resonant frequency shift Af f0 dependence on electromagnetic characteristics, in particular, electrical conductivity, dielectric permittivity,...
References
1. G. Binnig, C.F. Quate, C. Gerber, Atomic force microscope. Phys. Rev. Lett. 56, 930 1986 2. F.J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart, Subatomic features on the silicon 111 - 7 x 7 surface observed by atomic force microscopy. Science 289, 422 2000 3. N.A. Burnham, R. J. Colton, Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J. Vac. Sci. Technol. A 7, 2906 1989 4. M. Radmacher, J.P. Cleveland, M. Fritz, H.G. Hansma, P.K....
Fabrication
The fabrication process is outlined in Fig. 1.13. The probes are fabricated in parallel using optical lithography. The fabrication process starts with a silicon-on-insulator SOI wafer Fig. 1.13a . First, the height offset between the reference and moving grating fingers to ensure maximum force sensitivity is created using Local Oxidation of Silicon LOCOS . In this process, an 80-nm-thick layer of stoichiometric silicon nitride film is deposited using low pressure chemical vapor deposition LPCVD...
TimeResolved TappingMode Atomic Force Microscopy
Ali Fatih Sarioglu and Olav Solgaard Abstract Atomic force microscopy has unprecedented potential for quantitative mapping of material-specific surface properties on the nanoscale. Unfortunately, methods developed for local stiffness measurements suffer from low operational speeds and they require large forces to be applied to the surface, limiting resolution and precluding measurements on soft materials such as polymers and biological samples. On the other hand, tapping-mode AFM, which is well...
Contents
Part I Scanning Probe Microscopy Techniques 1 Time-Resolved Tapping-Mode Atomic Force Ali Fatih Sarioglu and Olav Solgaard 1.2 Tip-Sample Interactions in 1.2.1 Interaction Forces in 1.2.2 Cantilever Dynamics and Mechanical Bandwidth in 1.3 AFM Probes with Integrated Interferometric High Bandwidth Force 1.3.1 Model 1.3.2 Interferometric Grating 1.3.3 Sensor Mechanical Response amp Temporal Resolution 19 1.3.5 Detection Schemes 1.3.6 Characterization and 1.3.7 Time-Resolved Force 1.4 Imaging...
Contributors
Stefano Agnoli Dipartimento di Scienze Chimiche e unit di ricerca, INSTM, Universit di Padova, Via Marzolo 1, 35131 Padova, Italy, stefano.agnoli unipd.it Johan Angenete Nanofactory Instruments, Sven Hultins gata 9A, 412 88 Gothenburg, Sweden, johan.angenete nanofactory.com Arsen Babajanyan Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Korea, barsen12 gmail.com Mirko Ballarini Department of Physics, Politecnico di Torino, 10129...